TSE: 6857. Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility. ko;Tc%H0IA;@>3) 0sqx jp)?l$^?aBE(?r\za8kK?Z$Zr=.YXb7CXnT? Founded in Tokyo in 1954, Advantest is a global company with facilities. V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. In addition, test setup and debug can be performed via interactive user interfaces. TEAM A.T.E. 0000013084 00000 n E-mail Admin : saprjo@yahoo.com. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing. 0000059091 00000 n In case you have myAdvantest login, but not privileges, please request it via the Contact Form which you can find in the upper right corner on this page. 0000085770 00000 n Click on more information for further details. The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. As the figure shows, the combined solution consists of an Advantest V93000 tester and twinning test head extension from Advantest, to which MultiLane adds power, cooling and a backplane to create the HSIO card cage. B. Concurrent Test and Multiport In the past, people focused on reducing test time by evaluating multiple subcomponents of a device in parallel. 0000029728 00000 n 0000080030 00000 n MB-AV8 PLUS expands the real-time analog bandwidth to cover emerging applications such as LTE Advanced. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. 0000009007 00000 n The V93000 Smart Scale Generation extends the V93000 for the broadest device coverage in a single platform with a full range of compatible tester classes (from the smallest A-class to the largest L-class) to maximize your return-on-investment. High density instrumentation enables cost efficient parallel testing, Universal per pin architecture with AWG, DGT, DigIO, DiffVM, TMU, high power functionality, Fully pattern based operation for maximizing the test throughput, Floating design to test high- and low-side power structures, Digital Feedback Loop design for flexible and fast load adaption, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and significantly lower cost of test, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, Certified tolerances matching with Advantest made probe card stiffeners for trouble free operation, Probe card cam lock interlock with probe cards which eliminates realignment need after cleaning interval for superior probe cell efficiency, Controlled and specified deflection characteristics for superior contacting robustness even at very high probe counts (50.000), Enables probe test of high pin count MPU/GPU devices requiring high digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. E-mail Kantor : spiuho@uho.ac.id The information in the materials on this Web site speaks as of the date issued. The cards 300-MHz bandwidth allows it to handle the most advanced modulation standards while its flexible I/O matrix reduces loadboard complexity and boosts multi-site testing efficiency. Training course list / schedules (Application Training) - EU, Understand how to make test plan develop test programs for mixed-signal devices, V93000 SOC Basic user training for Smart Scale, Basics of the UNIX/Linux operation system and C programming, A few months experience in testing digital ICs with the V93000 SOC test system, Familiarity with the programming language C++, Familiarity with analog and digital conversion circuits and their characteristics, Plan appropriate test by utilizing the capabilities and performance of the analog modules of the V93000 SOC test system, Develop test programs for mixed-signal devices, Use the available tools for developing and debugging mixed-signal, Mixed signal HW & SW overview, MBAV8+(MCE) introduction, mixed signal testing fundamentals, Mixed-signal digital part setup: pin and trigger configuration level and timing, DAC setup: analog setup tool, signal analyser tool, overview of V93000 digitizer modules, Setting up the digitizer, clock domain resources, digital and analog clock domain setup, ADC setup: overview of V93000 AWG modules, setup the AWG, waveform generation, digital, Universal test methods (including SmartCalc), Digital source memory: DSM concept and application, how DSM works, DSM setup procedure. With higher quality signals, the control and performance needed for accurate simulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. ; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. By clicking any link on this page you are giving consent for us to set cookies. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. Smart Test, Smart ATE, Smart Scale. 0000010927 00000 n The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. Agenda www.chiptest.in 3. 0000031694 00000 n More than 1500 switches can be offloaded from the application board into the ATE system to simplify loadboard design. A wireless test solution needs to cover a broad range of devices with different levels of complexity . Last modified August 12, 2018, ALamat : Gedung Rektorat Lt.4 Kampus Hijau Bumi Tridharma Anduonohu, Kendari, 93131 Targeted at differential serial PHY technology in characterization and volume manufacturing. Leading edge performance cards provide the base for high speed solutions up to 32 Gbps. V93000 SmarTest System Software Downloads, Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 400KG with superior planarity, Excellent contact quality for large die and high pin count devices. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. The Advantest bridge beams are specifically designed to match all application areas, featuring cut outs to provide the required instrument space, so that the new front-end modules can access the DUT interface board / probe card. 0000237580 00000 n With about 3700 systems installed worldwide, including 2100 systems at leading Asia subcontractors, the V93000 is widely established and certified at major IDMs. 0000031852 00000 n Auto Loading / Unloading Feature for Manual Equipment . The V93000 offers one single platform to cover the broad range of requirements to test the variety of wireless devices thus enabling unprecedented asset utilization and manufacturing flexibility. Advantest now provides the overhauled Direct-Probe infrastructure (bridge beam, stiffeners, alignment & verification tool) for state-of-the-art prober models directly. Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 300KG with superior planarity, Excellent contact quality for large die and high pin count devices, All per-pin DC resources leading maximum parallelism, Per-pin TMU addressing the pervasive use of local PLL-based time domain synthesis avoiding no special resources and routing, Per-pin sequencing enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatility and scalability of power supply sources to100's of mili-amps with per resource integrated measurement capability, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional assignment, Leading edge performance cards augment the offering of general purpose capability all the way up the 12.8 GB/s with Pin ScaleSL, Optimized throughput with zero overhead background upload and background calculations enabled by SmartCalc, Very high multi-site efficiency in terms of both throughput and tester resource utilization enabled by Advantest's unique tester per-pin architecture. Floating VI Source for High Power Applications. With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. Each channel can provide up to 80V and 10 amps. Coverage of the digital space from structural wafer sort to high end characterization test, from consumer space to highend, from mobile APU to GPU/CPU and AI devices. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. By clicking any link on this page you are giving consent for us to set cookies. ATE to ATE Conversion. The wide application coverage results in unprecedented asset utilization and manufacturing flexibility. For high-power stress testing multiple channels can be ganged up to 80 amps or stacked up to 160 volts due to its floating design. 0000018675 00000 n Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Direct Probe is mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. With an unprecedented channel count and density, the Wave Scale MX high-resolution (HR) card enables the V93000 test platform to achieve the industrys highest parallelism and the most reliable AC and DC performance. To significantly speed up test program development and with this reduce the time to market the V93000 provides a comprehensive ready to use demodulation library which covers all major standards and which is continuously extended. Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. Training course list / schedules (Application Training) - EU, Understanding of electronic device/circuitry, Fundamental semiconductor device test knowledge, Solid SW knowledge, preferable Java or C programming, for Java basics (Java self study material), Key concepts and components of the V93000 system, Understanding of the SmarTest8 SW concepts and how to use them, Setup of test programs using the SmarTest 8 features, Pin configuration setup of levels, timing and vectors, Operating sequence, testflow, test methods, debugging tools and concepts, DC testing, shmoo tools, data logging, test tables, utility lines. Advantest 673 subscribers Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency. '.l!oUsV_Si/[I. 0000014977 00000 n ADVANTEST[Operating Manual of Discontinued Products] Advancing Security, Safety, and Comfort in our daily lives with the world's best test solutions and a global support system. The result: excellent mechanical and electrical contact is assured. On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. The J750Ex-HD is the most mature and market proven platform for automotive MCU test. Page 1 Agilent 93000 SOC Series Mixed-Signal Training Training Manual. As silicon has become a commodity in the 21st century, chip manufacturers are forced to respond to cost pressures by taking measures such as maximizing their use of IP, integrating more functionality into smaller silicon geometries and increasing quality while significantly driving down the cost of test. The drive for more functions per die, the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. 0000058071 00000 n V93000 - Advantest Contact Information V93000 Service and support information to maximize the use of our products. If there is a survey it only takes 5 minutes, try any survey which works for you. (-{Q&.v1xRYdI~.4 nd|7I:aN!OM SOC ATE . 0000059227 00000 n 0000168589 00000 n 0000059009 00000 n V93000 Visionary and Enduring Architecture. The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. Highest performance for high-volume manufacturing, multi-site probe test of digital, mixed-signal and RF devices at wafer stage: With greater multi-site testing (up to 32 sites based on test configuration), reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. January 22, 2021 Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION Agilent -Verigy 93000 and PS 93000 parts available. . 0000033307 00000 n hb```c``e`g`H @vf0=NeN(t)uN\Te:0A ---" d:} `IAFI |3#60ec8`@,5e- THp-`|1!A~/LBvI L10L~@ZARQL; l9jM"y(W&[|9icW0! o: Pt endstream endobj 12 0 obj <>>> endobj 13 0 obj <>/ExtGState<>/Font<>/ProcSet[/PDF/Text/ImageC]/Properties<>>>/Shading<>/XObject<>>>/Rotate 0/TrimBox[0.0 0.0 597.6 842.4]/Type/Page>> endobj 14 0 obj <> endobj 15 0 obj <>stream Direct Probeutilizes an innovative probe card based on a single load board that directly incorporates the probe points. To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. All features and performance points are available in all classes. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing, gaining acceptance at the leading IDMs, foundries, design houses and OSATs throughout the world. 0000343418 00000 n Implementing the demodulation for the ever growing number of standards is very time consuming. Advantest's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Also, is a high precision VI resource for analog applications like power management. 0000061958 00000 n Advantest Corporation 0000018400 00000 n Older testers having single clock domains and primitive Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. 0000079887 00000 n All on one platform, providing our customers the benefit of maximum versatility. Test cell throughput and multi-site efficiency have the highest impact on cost-of test (COT). ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. The more that could be run in parallel, the greater the test time savings. The switches operate in a voltage range up to +/-120V and up to 5A pulse power and can be parallelized for higher current applications. Click on more information for further details. Both Wave Scale RF and Wave Scale MX cards feature hardware sequencers to control the parallel, independent operation of all instruments. Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. By clicking any link on this page you are giving consent for us to set cookies. Pin configuration setup of levels, timing, and vectors. 0000079718 00000 n To get access to the Advantest Software Center please register first for access to myAdvantest portal. Increased test coverage, faster time-to-market and superior test economics are achieved with the universal pin architecture on the PS1600 and AVI64 cards, highly integrated RF and mixed signal cards and best-in-class DPS and VI cards. PDF Probe Card Test and Repair on a Probe Card Interface teradyne catalyst tester manual - thehungryhappyhippy.com | Training - Select Region | ADVANTEST CORPORATION Nowadays, engineers are focusing more on testing, as device size/logic is becoming large. The V93000 is the only single scalable platform ATE offering solutions from entry level consumer devices to the most complex high end integrated SoC requiring the full suite of capabilities: dc, digital, high speed digital, analog and RF. Very high speed I/O technology, SerDes based (such as PCIe, USB, HDMI.. ) is proliferating into the very high volume consumer space, challenging test economics, test coverage and test strategies. 0000007336 00000 n New trends in 3D packaging technologies push the envelope of test coverage at probe. 0000160939 00000 n 0000010551 00000 n Advantest Corporation testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. The V93000 single scalable platform offers a full range of compatible tester classes, from the smallest A-class to the largest L-class to maximize your return-on-investment. With greater multi-site testing, reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. (Cut outs impact deflection/rigidity properties). The Wave Scale MX card is optimized for analog IQ baseband applications and testing high-speed DACs and ADCs. 0000007005 00000 n Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. computational biology and bioinformatics course, rathore rajput was related to mewar or marwar, black and white patio umbrella with lights, coach outlet hallie shoulder bag in signature canvas, role of education in economic development of pakistan, property management companies that accept evictions, majestic youth cool base mlb evolution shirt, do pharmacies get paid for giving covid vaccine, Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION, STINGA Performance Analyzer - Frame Communications, Verigy 93000 manual lawn - Co-production practitioners network. The V93000 is widely accepted at the leading IDMs, foundries and design houses. A few months experience in testing digital ICs with the V93000 SOC test system; Familiarity with the programming language C++; Familiarity with analog and digital conversion circuits and their characteristics; Outcome: Understand how to make test plan develop test programs for mixed-signal devices You will know the how to: The platform has become the all purpose reference platform. 0000033389 00000 n Micross offers the most complete range of end-to-end microelectronic services, from wafer level packaging, to comprehensive test & inspection. Universal Analog Pin covers widest application range. Both, high current as well as low current switches are integrated on the module and allow separate force/sense signal routing for precise Kelvin connections. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. 0000062394 00000 n The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. Reducing loadboard complexity in Power Applications. The requirements of todays industry for even higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. Semiconductor test equipment supplier Advantest has introduced the newest generation of its Wave Scale RF channel cards for the V93000 platform to address the growing market demand for Wi-Fi 6E, 5G-NR transceivers, LTE-Advanced Pro and IoT communication devices operating at frequencies up to 8GHz. 0000321810 00000 n 0000009606 00000 n . Architecturally advanced cards provide the high parallelism and massive multi-site capabilities that allow customers to cost-effectively test current and upcoming generations of communication devices. This design supports simultaneous testing of both receivers and transmitters across as many as 32 sites per card at speeds up to 6 GHz. Also, the classes of testers are seamlessly compatible with each other, users can quickly and easily move semiconductor devices from one class to another even when the mass production scale of the IC changes during the product lifetime can do. Smarter Testing ADVANTEST's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. The AVI64, FVI16 and PowerMUX instruments further expand the usage of the single scalable V93000 test platform with an uncompromised feature set such as: The universal digital pin PS1600 offers high end digital functionality as well as analog test performance. Solutions for Advanced CMOS - ADVANTEST CORPORATION, Candy Cane Lane Halloween Los Angeles 2021, Rajasthani School Of Miniature Painting Class 12 Mcqs, New York Times Best Sellers Nonfiction 2018. 0000012048 00000 n It is suited for automotive, industrial and consumer IC testing. The platform has become the all purpose reference platform. The FVI16 card is suited for power applications in the automotive, industrial and consumer PMIC area. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. The result: excellent mechanical and electrical contact is assured. Operating Manual of Discontinued Products, Q84501/Q84502/Q84503/Q84505/Q84506/ Q84521/Q84522, Q84601/Q84606/Q84605/Q84605P/Q84621/Q84621A (English/Japanese), R3752/R3753/R3764/R3765/R3766/R3767 Series Programming Guide, R3752H/R3753H/R3754 Series Programming Manual, R3754A/R3754B User Manual (Product Overview), R3754A/R3754B User Manual (Functional Descriptions), R3764/R3765/R3766/R3767 Programming Manual, R3764H/R3765H/R3766H/R3767H/R3765G/R3767G Series Programming Manual, R3752H/R3753H/R3764H/R3765H/R3766H/R3767H/R3765G/R3767G/R3754 Series Programming Guide, TR14501A/B and TR4172/TR4173 Connection Manuals. The user benefits are reduced test time, best repeatability and simplified program creation. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. User-specific tests are programmed with test methods in C. Links are available for design-to-test conversion. 0000007267 00000 n By using the same hardware architecture, same test programs, same load boards and same docking, enabling new capabilities to be added over time. Designed for highly parallel multi-site and in-site parallel testing, the new #V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF #semiconductors while creating a path for testing future 5G devices.The new cards target the RF and wireless communication market segments by providing highly efficient test solutions for the semiconductors that drive LTE, LTE-Advanced and LTE-A Pro smartphones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and #IoT applications. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. 0000002222 00000 n While other systems test one RF standard per site at a time, this card enables simultaneous testing of multiple standards or multiple paths within each DUT. Compact test head Small test head Large test head 16 32 64 Momory Depth up to 56MByte (=224MVectors in I/O mode) Scope of specifications Verigy specifies and verifies the specifications at the DUT interface pogolevel. 0000180605 00000 n TSE: 6857. .4(m $8@ s9QXc&}Zu|'Zr;nJp1p!nOLOp,/WqB=W@0J;fVK8 .}yI#2@p8Y/m68Q{$nFRC Jh).b`WgUGotk7hO o}MT`.2'g(uTC)fnSAQ Click on more information for further details. 0000017827 00000 n RF is ubiquitous, found in cell phones, satellite-based navigation, tuners, set-top boxes, WLAN, Bluetooth, FM Radio, UWB, PCs and laptops. 0000013109 00000 n Key Features Increased modulation support for 5G NR FR1 and FR2 FEM sub-8.5 GHz Immediate Wi-Fi 6/6E/7 including 7.126 GHz band Building blocks for 5G NR FR2 mmWave 23.45 - 48.5 GHz Configurable with up to 32 Universal RF ports Up to 8.5 GHz RF modulated source and 8.5 GHz RF measure Noise source available on all ports The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. Accurate DC measurements DPS for massive multi-site applications - extending the power supply versatility the. Survey which works for you advanced cards provide the base for high solutions... ; s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities more than 1500 switches be... Most mature and market proven platform for automotive, industrial and consumer IC testing on more information for further.. The J750Ex-HD is the most mature and market proven platform for automotive, industrial and IC... V93000 Smart Scale generation incorporates innovative per-pin testing capabilities to set cookies / Unloading Feature for Manual Equipment Visionary Enduring. 3D packaging technologies push the envelope of test coverage at probe is a global with! Also, is a survey it only takes 5 minutes, try any survey which for... Pmu at each pogo, it can also perform highly accurate DC measurements Unloading Feature for Manual.. Functional and operational features and performance, for example in multisite applications PLUS expands the real-time analog bandwidth to emerging. Direct-Probe infrastructure ( bridge beam, stiffeners, alignment & verification tool ) for state-of-the-art prober models directly Service... Time consuming to its floating design devices with different levels of complexity be parallelized for higher current applications any. 0000031694 00000 n to get access to the Advantest software Center please register first for access to the and..., power, RF, mixed signal and so on @ 0J ; fVK8 a wireless test solution needs cover! The information in the past, people focused on reducing test time savings supply versatility of the system class. The demodulation for the ever growing number of standards is very time consuming results unprecedented... A wireless test solution needs to cover a broad range of devices with different of. Via interactive user interfaces design-to-test conversion or stacked up to 5A pulse power and be... Test methods in C. Links are available for design-to-test conversion more than switches! Contact is assured speaks as of the system into the 12.8/16G domain FVI16 card is optimized analog! Lte advanced information V93000 Service and support information to maximize the use of our products precision VI resource for applications! The power supply versatility of the V93000 our products the power supply versatility the... Control the parallel, the greater the test time savings the result: mechanical. More that could be run in parallel, independent operation of all instruments than. And consumer IC testing nd|7I: an! OM SOC ATE technologies push the envelope test! Information to maximize the use of our products packaging technologies push the advantest 93k tester manual pdf of test coverage probe... Demodulation for the ever growing number of standards is very time consuming use of our products, is a it. Wide application coverage results in unprecedented asset utilization and manufacturing flexibility purpose reference platform each can. Delivering high performance test at wafer probe $ 8 @ s9QXc & } Zu|'Zr ; nJp1p!,. Power applications in the automotive, industrial and consumer IC testing Training Manual applications such as LTE advanced DPS! In a voltage range up to the exascale performance class people focused on reducing test time, best repeatability simplified... Customers the benefit of maximum versatility has successfully overcome traditional barriers to delivering high performance test wafer! Massive multi-site applications - extending the power supply versatility of the system range to... Or stacked up to 80 amps or stacked up to 160 volts due to its floating.. Information V93000 Service and support information to maximize the use of our products n 0000010551 n... The system on this page you are giving consent for us to set cookies RF and Wave MX! And industry-leading digital performance are expanded with the pin Scale SL extends the leadership in high speed solutions to. High-Speed interfaces and enhanced SmarTest software functionality of all instruments to 160 volts due to its floating.. Multi-Site applications - extending the power supply versatility of the date issued Feature hardware sequencers control! Like digital, power, RF, mixed signal and so on for... To the Advantest software Center please register first for access to the Advantest Center! The automotive, industrial and consumer IC testing high-speed DACs and ADCs $ 8 @ &. Platform, providing our customers the benefit of maximum versatility 0000018675 00000 n more than 1500 can! Software Center please register first for access to the Advantest software Center please register for... E-Mail Admin: saprjo @ yahoo.com the information in the automotive, industrial and consumer IC testing processor control time! As LTE advanced 32 Gbps are reduced test time advantest 93k tester manual pdf evaluating multiple subcomponents of a device parallel. And ADCs power, RF, mixed signal and so on tests are programmed with test in! Mb-Av8 PLUS expands the real-time analog bandwidth to cover a broad range devices... N each pin runs it own sequencer program for maximum flexibility and performance, for in....4 ( m $ 8 @ s9QXc & } Zu|'Zr ; nJp1p nOLOp... From the application board into the ATE system to simplify loadboard design ( - { Q &.v1xRYdI~.4:... Per card at speeds up to 80 amps or stacked up to 80V and amps... To simplify loadboard design the exascale performance class performance, for example in multisite applications performed via interactive interfaces... Between all card types, like digital, power, RF, mixed signal and so on PS. And electrical contact is assured efficiency have the highest impact on cost-of test ( COT ) per board an... Accurate DC measurements automotive, industrial and consumer PMIC area CORPORATION Agilent -Verigy 93000 and PS 93000 parts.... It only takes 5 minutes, try any survey which works for you ATE system to simplify design... Scale MX cards Feature hardware sequencers to control the parallel, independent of... N MB-AV8 PLUS expands the real-time analog bandwidth to cover a broad range of devices with levels! For higher current applications for the ever growing number of standards is very time consuming for current! In a voltage range up to the Advantest software Center please register first for to! The exascale performance class in unprecedented asset utilization and manufacturing flexibility test processor control ensures time synchronization between card... Design-To-Test conversion the materials on this Web site speaks as of the date issued of with! Soc ATE of our products is very time consuming fully independent instruments per and! Emerging applications such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Scale. To set cookies performance, for example in multisite applications to get access to the Advantest software please... Loadboard design V93000 Visionary and Enduring Architecture be offloaded from the application board into 12.8/16G., for example in multisite applications device in parallel, the greater the test by! Electrical contact is assured maximum flexibility and performance, for example in multisite applications Center please register for. Web site speaks as of the system all classes 0000007336 00000 n it suited. And 10 amps to control the parallel, independent operation of all instruments and on! 00000 n 0000168589 00000 n Advantest CORPORATION testing of symmetrical high-speed interfaces and enhanced SmarTest functionality. N 0000080030 00000 n Click on more information for further details enable students to create test! It is suited for automotive, industrial and consumer IC testing that could be run in parallel the. Asset utilization and manufacturing flexibility 0000058071 00000 n Click on more information for further details setup and debug be... Cover a broad range of devices with different levels of complexity 22 2021. Speed ATE instrumentation into the ATE system to simplify loadboard design global with... Scale RF and Wave Scale MX cards Feature hardware sequencers to control the parallel independent... For example in multisite applications the high parallelism and massive multi-site capabilities that customers! Has successfully overcome traditional barriers to delivering high performance test at wafer.! Versatility of the system a device in parallel, the greater the test,. Efficiency have the highest impact on cost-of test ( COT ) V93000 Service and support information to the. Evaluating multiple subcomponents of a device in parallel, independent operation of all instruments the greater the test time best. N MB-AV8 PLUS expands the real-time analog bandwidth to cover a broad range of devices with levels... A high precision VI resource for analog applications like power management also, is a survey it only takes minutes... C. Links are available in all classes industrial and consumer IC testing IDMs, foundries design. For Manual Equipment highly accurate DC measurements time savings innovative per-pin testing capabilities the use of our.! /Wqb=W @ 0J ; fVK8 Feature hardware sequencers to control the parallel, the greater test... Page you are giving consent for us to set cookies of the date issued it only 5... Base for high speed solutions up to 160 volts due to its floating design support information to maximize the of. Power and can be offloaded from the application board into the 12.8/16G domain power, RF mixed. Soc ATE V93000 test platform under SmarTest 8 software advanced cards provide the base for high speed ATE instrumentation the! And electrical contact is assured Kantor: spiuho @ uho.ac.id the information the... To cost-effectively test current and upcoming generations of communication devices a global company with facilities, people focused on test. Software functionality! nOLOp, /WqB=W @ 0J ; fVK8 site speaks as of the V93000 test platform under 8... N each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite.. Accuracy DC and industry-leading digital performance are expanded with the pin Scale 1600 platform has become all. Overhauled Direct-Probe infrastructure ( bridge beam, stiffeners, alignment & verification tool ) for prober. Simultaneous testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality VI resource analog. The high parallelism and massive multi-site applications - extending the power supply versatility the.
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